Abstract
Eye-diagram-based evaluation of a 65 nm CMOS OOK modulator up to 50 Gb/s, examining how output impedance matching affects rise/fall times across communication-chain bandwidths.
2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)
Eye-diagram-based evaluation of a 65 nm CMOS OOK modulator up to 50 Gb/s, examining how output impedance matching affects rise/fall times across communication-chain bandwidths.